Local structural and polar Kerr effect measurements on an ultrathin epitaxial Co wedge grown on Pd(111)

Purcell, S. T. ; Johnson, M. T. ; McGee, N. W. E. ; de Vries, J. J. ; Zeper, W. B. ; Hoving, W.

[S.l.] : American Institute of Physics (AIP)
Published 1993
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A Pd/Co double layer has been grown epitaxially in ultrahigh vacuum on a Pd(111) single crystal, with the Co in the shape of a wedge of thickness varying from 0 to 10 monolayers (ML). The polar magneto-optical Kerr effect has been used to make a nearly continuous set of measurements of the magnetic properties as a function of Co thickness tCo. The coercive fields Hc and nucleation fields Hn show large, well-defined maxima at tCo∼2.3 ML. Between 4 and 9 ML, we find that Hc falls with increasing thickness according to a tCo−5/2 dependence. The Kerr ellipticity and Kerr rotation depend linearly on Co thickness above ∼2 ML Co, but show appreciable offsets when extrapolated to tCo=0. These offsets are clear evidence of the polarization of Pd near the interfaces. Extensive in situ growth studies of the structure of the films are also reported.
Type of Medium:
Electronic Resource
URL: