High-resolution x-ray scattering studies of epitaxial GdBa2Cu3O7−δ thin films
Cox, U. J. ; Crain, J. ; Hatton, P. D. ; Green, G. S. ; Dai, D. Y.
[S.l.] : American Institute of Physics (AIP)
Published 1994
[S.l.] : American Institute of Physics (AIP)
Published 1994
| ISSN: |
1089-7550
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
High-resolution triple-crystal x-ray scattering techniques have been used to study high-temperature superconducting thin films of Gd-Ba-Cu-O grown in situ by dc magnetron sputtering onto substrates of (001) LaAlO3 and SrTiO3. The measurements suggest that the thin films are single crystal. Evidence is found for both c- and a-axis-oriented films on the LaAlO3 samples. In particular, no strain is observed in the films except at the interface between films of different relative orientation. No low-temperature structural transitions are observed in the films.
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| Type of Medium: |
Electronic Resource
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| URL: |