Photoresponse of a YBa2Cu3Ox grain-boundary junction
Park, J. H. ; Kim, D. H. ; Kim, Y. H. ; Kang, W. N. ; Choi, S. S. ; Hahn, T. S. ; Khim, Z. G.
[S.l.] : American Institute of Physics (AIP)
Published 1996
[S.l.] : American Institute of Physics (AIP)
Published 1996
| ISSN: |
1089-7550
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
The photoresponse of a YBa2Cu3Ox grain-boundary junction has been measured as a function of chopping frequency and bias current in a temperature range of 2 K≤T≤70 K. The response was found to be mostly bolometric, but a nonbolometriclike component was also identified, which appeared as a chopping-frequency independent signal while immersing the sample in the superfluid helium. The bias-current dependence of the response showed a peak at a current corresponding to the critical current of the junction, and the peak values remained constant for 30 K≤T≤70 K. However, below 15 K the peak of the photoresponse increased very sharply with decreasing temperature following a 1/T3 dependence, consistent with the temperature dependence of the thermal boundary resistance between the film and the substrate. © 1996 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |