The role of NiAl underlayers in longitudinal thin-film recording media
Ross, C. A. ; Nolan, T. P. ; Ranjan, R. ; Lu, D.
[S.l.] : American Institute of Physics (AIP)
Published 1997
[S.l.] : American Institute of Physics (AIP)
Published 1997
| ISSN: |
1089-7550
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Longitudinal recording media made with chromium and with nickel-aluminum underlayers are compared. NiAl films have smaller grains and random crystallographic orientation, while Cr films have larger grains and either a {110} or a {200} preferred orientation depending on the deposition conditions. Cobalt alloy films grown on NiAl have nearly random crystallographic orientation and significant c-axis out-of-plane component, and lower hysteresis loop squareness and coercivity than films made on a heated Cr underlayer. NiAl-underlayer media do not exhibit in-plane magnetic anisotropy induced by the substrate texture lines. CoCrTaPt/Cr/NiAl media had higher overwrite than CoCrTaPt/Cr media due to higher coercive squareness and a sharper hysteresis loop closure. © 1997 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |