Intrinsic trapping sites in rare-earth and yttrium oxyorthosilicates
Cooke, D. W. ; Bennett, B. L. ; Muenchausen, R. E. ; McClellan, K. J. ; Roper, J. M. ; Whittaker, M. T.
[S.l.] : American Institute of Physics (AIP)
Published 1999
[S.l.] : American Institute of Physics (AIP)
Published 1999
ISSN: |
1089-7550
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Source: |
AIP Digital Archive
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Topics: |
Physics
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Notes: |
Similarity among the thermally stimulated luminescence glow curves of undoped Lu2SiO5 and Ce3+-doped oxyorthosilicates possessing the monoclinic C2/c structure strongly suggests the luminescence traps are intrinsic in origin. They are most likely associated with the configuration of oxygen ions in the vicinity of not only the Ce3+ ion, as suggested in previous work, but also the host lanthanide ion. The optical absorption spectrum of pristine Lu2SiO5 shows the presence of intrinsic absorption centers that are enhanced upon x irradiation as seen in other oxides containing oxygen related point defects. © 1999 American Institute of Physics.
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Type of Medium: |
Electronic Resource
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URL: |