Investigation of the influence of edge structure on the micromagnetic behavior of small magnetic elements
Herrmann, M. ; McVitie, S. ; Chapman, J. N.
[S.l.] : American Institute of Physics (AIP)
Published 2000
[S.l.] : American Institute of Physics (AIP)
Published 2000
| ISSN: |
1089-7550
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Thin film elements of a soft magnetic nickel–iron alloy have been fabricated with structured edges in order to determine their effect on the magnetization reversal processes. Lorentz microscopy was used to study acicular elements with different edge structures and these were compared with standard elements with straight edges. The presence of the structured edges results in deviations of the magnetization along the length of the elements in the remanent state. Switching processes are described for a number of different elements and the effect of structuring the edges is discussed. © 2000 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |