Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations
| ISSN: |
1089-7550
|
|---|---|
| Source: |
AIP Digital Archive
|
| Topics: |
Physics
|
| Notes: |
The fundamental electromagnetic properties of left-handed materials (LHMs) are reviewed and verified by finite-element method full-wave analysis using rectangular waveguide structures loaded by a LHM and adopting an effective medium approach. The negative phase velocity, positive intrinsic impedance, and modified boundary conditions at an interface with a right-handed medium are verified by loading a waveguide section with a LHM that has edges perpendicular to the waveguide axis. In addition, the negative angle of refraction is demonstrated by loading the junction of a T-junction waveguide with a LHM having one edge 45° with respect to the waveguide axis. These properties are shown by the evolution of wave fronts in the LHM and by analysis of the S-parameters of the waveguide structures. © 2001 American Institute of Physics.
|
| Type of Medium: |
Electronic Resource
|
| URL: |
| _version_ | 1798289683794362369 |
|---|---|
| autor | Caloz, C. Chang, C.-C. Itoh, T. |
| autorsonst | Caloz, C. Chang, C.-C. Itoh, T. |
| book_url | http://dx.doi.org/10.1063/1.1408261 |
| datenlieferant | nat_lic_papers |
| hauptsatz | hsatz_simple |
| identnr | NLZ218365896 |
| iqvoc_descriptor_title | iqvoc_00000092:materials |
| issn | 1089-7550 |
| journal_name | Journal of Applied Physics |
| materialart | 1 |
| notes | The fundamental electromagnetic properties of left-handed materials (LHMs) are reviewed and verified by finite-element method full-wave analysis using rectangular waveguide structures loaded by a LHM and adopting an effective medium approach. The negative phase velocity, positive intrinsic impedance, and modified boundary conditions at an interface with a right-handed medium are verified by loading a waveguide section with a LHM that has edges perpendicular to the waveguide axis. In addition, the negative angle of refraction is demonstrated by loading the junction of a T-junction waveguide with a LHM having one edge 45° with respect to the waveguide axis. These properties are shown by the evolution of wave fronts in the LHM and by analysis of the S-parameters of the waveguide structures. © 2001 American Institute of Physics. |
| package_name | American Institute of Physics (AIP) |
| publikationsjahr_anzeige | 2001 |
| publikationsjahr_facette | 2001 |
| publikationsjahr_intervall | 7999:2000-2004 |
| publikationsjahr_sort | 2001 |
| publikationsort | [S.l.] |
| publisher | American Institute of Physics (AIP) |
| reference | 90 (2001), S. 5483-5486 |
| search_space | articles |
| shingle_author_1 | Caloz, C. Chang, C.-C. Itoh, T. |
| shingle_author_2 | Caloz, C. Chang, C.-C. Itoh, T. |
| shingle_author_3 | Caloz, C. Chang, C.-C. Itoh, T. |
| shingle_author_4 | Caloz, C. Chang, C.-C. Itoh, T. |
| shingle_catch_all_1 | Caloz, C. Chang, C.-C. Itoh, T. Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations The fundamental electromagnetic properties of left-handed materials (LHMs) are reviewed and verified by finite-element method full-wave analysis using rectangular waveguide structures loaded by a LHM and adopting an effective medium approach. The negative phase velocity, positive intrinsic impedance, and modified boundary conditions at an interface with a right-handed medium are verified by loading a waveguide section with a LHM that has edges perpendicular to the waveguide axis. In addition, the negative angle of refraction is demonstrated by loading the junction of a T-junction waveguide with a LHM having one edge 45° with respect to the waveguide axis. These properties are shown by the evolution of wave fronts in the LHM and by analysis of the S-parameters of the waveguide structures. © 2001 American Institute of Physics. 1089-7550 10897550 American Institute of Physics (AIP) |
| shingle_catch_all_2 | Caloz, C. Chang, C.-C. Itoh, T. Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations The fundamental electromagnetic properties of left-handed materials (LHMs) are reviewed and verified by finite-element method full-wave analysis using rectangular waveguide structures loaded by a LHM and adopting an effective medium approach. The negative phase velocity, positive intrinsic impedance, and modified boundary conditions at an interface with a right-handed medium are verified by loading a waveguide section with a LHM that has edges perpendicular to the waveguide axis. In addition, the negative angle of refraction is demonstrated by loading the junction of a T-junction waveguide with a LHM having one edge 45° with respect to the waveguide axis. These properties are shown by the evolution of wave fronts in the LHM and by analysis of the S-parameters of the waveguide structures. © 2001 American Institute of Physics. 1089-7550 10897550 American Institute of Physics (AIP) |
| shingle_catch_all_3 | Caloz, C. Chang, C.-C. Itoh, T. Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations The fundamental electromagnetic properties of left-handed materials (LHMs) are reviewed and verified by finite-element method full-wave analysis using rectangular waveguide structures loaded by a LHM and adopting an effective medium approach. The negative phase velocity, positive intrinsic impedance, and modified boundary conditions at an interface with a right-handed medium are verified by loading a waveguide section with a LHM that has edges perpendicular to the waveguide axis. In addition, the negative angle of refraction is demonstrated by loading the junction of a T-junction waveguide with a LHM having one edge 45° with respect to the waveguide axis. These properties are shown by the evolution of wave fronts in the LHM and by analysis of the S-parameters of the waveguide structures. © 2001 American Institute of Physics. 1089-7550 10897550 American Institute of Physics (AIP) |
| shingle_catch_all_4 | Caloz, C. Chang, C.-C. Itoh, T. Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations The fundamental electromagnetic properties of left-handed materials (LHMs) are reviewed and verified by finite-element method full-wave analysis using rectangular waveguide structures loaded by a LHM and adopting an effective medium approach. The negative phase velocity, positive intrinsic impedance, and modified boundary conditions at an interface with a right-handed medium are verified by loading a waveguide section with a LHM that has edges perpendicular to the waveguide axis. In addition, the negative angle of refraction is demonstrated by loading the junction of a T-junction waveguide with a LHM having one edge 45° with respect to the waveguide axis. These properties are shown by the evolution of wave fronts in the LHM and by analysis of the S-parameters of the waveguide structures. © 2001 American Institute of Physics. 1089-7550 10897550 American Institute of Physics (AIP) |
| shingle_title_1 | Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations |
| shingle_title_2 | Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations |
| shingle_title_3 | Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations |
| shingle_title_4 | Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations |
| sigel_instance_filter | dkfz geomar wilbert ipn albert |
| source_archive | AIP Digital Archive |
| timestamp | 2024-05-06T08:04:44.423Z |
| titel | Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations |
| titel_suche | Full-wave verification of the fundamental properties of left-handed materials in waveguide configurations |
| topic | U |
| uid | nat_lic_papers_NLZ218365896 |