Wavelength dependence of photorefractive effect in Ti-indiffused LiNbO3 waveguides
Fujiwara, T. ; Sato, S. ; Mori, H.
Woodbury, NY : American Institute of Physics (AIP)
Published 1989
Woodbury, NY : American Institute of Physics (AIP)
Published 1989
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
A novel method of measuring the photorefractive sensitivity of Ti-diffused channel waveguides in lithium niobate is proposed and demonstrated. It is suited for quantifying the dependence of the photorefractive sensitivity on the irradiation beam wavelength. From measurements at various irradiation intensities and wavelengths 0.633, 0.81, and 1.06 μm, we give an estimate of the crosstalk of a directional coupler as a function of irradiation intensity and wavelength.
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| Type of Medium: |
Electronic Resource
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| URL: |