Ashby, C. I. H., Myers, D. R., Vawter, G. A., & Biefeld, R. M. (1989). Carrier-lifetime control of photochemical dry etching using elevated impurity concentrations. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationAshby, C. I. H., D. R. Myers, G. A. Vawter, and R. M. Biefeld. Carrier-lifetime Control of Photochemical Dry Etching Using Elevated Impurity Concentrations. Woodbury, NY: American Institute of Physics (AIP), 1989.
MLA (9th ed.) CitationAshby, C. I. H., et al. Carrier-lifetime Control of Photochemical Dry Etching Using Elevated Impurity Concentrations. American Institute of Physics (AIP), 1989.
Warning: These citations may not always be 100% accurate.