Image formation in a superresolution phase conjugate scanning microscope
Johnson, K. M. ; Cathey, W. T. ; Mao, C. C.
Woodbury, NY : American Institute of Physics (AIP)
Published 1989
Woodbury, NY : American Institute of Physics (AIP)
Published 1989
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Analytical and experimental results of a new type of optical scanning microscope, which uses a phase conjugate mirror and pinholes to achieve superresolution, are presented. This phase conjugate scanning microscope has a higher Rayleigh resolution limit than conventional, single-pass, and double-pass scanning microscopes.
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| Type of Medium: |
Electronic Resource
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| URL: |