Improved electronic properties of GaAs surfaces stabilized with phosphorus

Viktorovitch, P. ; Gendry, M. ; Krawczyk, S. K. ; Krafft, F. ; Abraham, P. ; Bekkaoui, A. ; Monteil, Y.

Woodbury, NY : American Institute of Physics (AIP)
Published 1991
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We report on a new passivation procedure of the GaAs surface based on a thermal treatment under a PH3 overpressure. This treatment results, by As/P exchange, in the formation of a thin superficial GaP layer which prevents the formation of an arsenic oxide, as observed by x-ray photoelectron spectroscopy analysis. Subsequent increase of the photoluminescence signal indicates improved electronic properties of GaAs surfaces as a result of this passivation procedure.
Type of Medium:
Electronic Resource
URL: