Linewidth broadening factor of a microcavity semiconductor laser

Jin, R. ; Boggavarapu, D. ; Khitrova, G. ; Gibbs, H. M. ; Hu, Y. Z. ; Koch, S. W. ; Peyghambarian, N.

Woodbury, NY : American Institute of Physics (AIP)
Published 1992
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The emission linewidth above threshold is measured in a GaAs/AlGaAs microcavity surface-emitting laser with a single cavity mode. The measured linewidth broadening factor is in good agreement with theoretical calculations that include the most important many-body Coulomb effects of the electron-hole plasma.
Type of Medium:
Electronic Resource
URL: