Linewidth broadening factor of a microcavity semiconductor laser
Jin, R. ; Boggavarapu, D. ; Khitrova, G. ; Gibbs, H. M. ; Hu, Y. Z. ; Koch, S. W. ; Peyghambarian, N.
Woodbury, NY : American Institute of Physics (AIP)
Published 1992
Woodbury, NY : American Institute of Physics (AIP)
Published 1992
ISSN: |
1077-3118
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Source: |
AIP Digital Archive
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Topics: |
Physics
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Notes: |
The emission linewidth above threshold is measured in a GaAs/AlGaAs microcavity surface-emitting laser with a single cavity mode. The measured linewidth broadening factor is in good agreement with theoretical calculations that include the most important many-body Coulomb effects of the electron-hole plasma.
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Type of Medium: |
Electronic Resource
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URL: |