Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures

Singh, R. K. ; Gilbert, D. ; Tellshow, R. ; Holloway, P. H. ; Ochoa, R. ; Simmons, J. H. ; Koba, R.

Woodbury, NY : American Institute of Physics (AIP)
Published 1992
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have deposited diamond thin films remote from the active plasma region using an electron cyclotron resonance chemical vapor deposition technique. Diamond films were fabricated at temperatures in the range of 550–650 °C and gas pressures between 25 and 60 mTorr. The volume ratio of water to methanol was varied from 1:20 to 1:5 to optimize diamond film growth. High methanol content resulted in multiple nucleation in the growing diamond film, while higher water content led to complete etching of the film. A positive electrical bias was found to be essential for diamond thin film growth remote from the plasma region. The films were characterized by x-ray diffraction, micro-Raman, and scanning electron microscopy for phase identification, surface morphology, and bonding characteristics.
Type of Medium:
Electronic Resource
URL:
_version_ 1798289625381339136
autor Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
autorsonst Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
book_url http://dx.doi.org/10.1063/1.108058
datenlieferant nat_lic_papers
hauptsatz hsatz_simple
identnr NLZ218239394
issn 1077-3118
journal_name Applied Physics Letters
materialart 1
notes We have deposited diamond thin films remote from the active plasma region using an electron cyclotron resonance chemical vapor deposition technique. Diamond films were fabricated at temperatures in the range of 550–650 °C and gas pressures between 25 and 60 mTorr. The volume ratio of water to methanol was varied from 1:20 to 1:5 to optimize diamond film growth. High methanol content resulted in multiple nucleation in the growing diamond film, while higher water content led to complete etching of the film. A positive electrical bias was found to be essential for diamond thin film growth remote from the plasma region. The films were characterized by x-ray diffraction, micro-Raman, and scanning electron microscopy for phase identification, surface morphology, and bonding characteristics.
package_name American Institute of Physics (AIP)
publikationsjahr_anzeige 1992
publikationsjahr_facette 1992
publikationsjahr_intervall 8009:1990-1994
publikationsjahr_sort 1992
publikationsort Woodbury, NY
publisher American Institute of Physics (AIP)
reference 61 (1992), S. 2863-2865
search_space articles
shingle_author_1 Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
shingle_author_2 Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
shingle_author_3 Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
shingle_author_4 Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
shingle_catch_all_1 Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
We have deposited diamond thin films remote from the active plasma region using an electron cyclotron resonance chemical vapor deposition technique. Diamond films were fabricated at temperatures in the range of 550–650 °C and gas pressures between 25 and 60 mTorr. The volume ratio of water to methanol was varied from 1:20 to 1:5 to optimize diamond film growth. High methanol content resulted in multiple nucleation in the growing diamond film, while higher water content led to complete etching of the film. A positive electrical bias was found to be essential for diamond thin film growth remote from the plasma region. The films were characterized by x-ray diffraction, micro-Raman, and scanning electron microscopy for phase identification, surface morphology, and bonding characteristics.
1077-3118
10773118
American Institute of Physics (AIP)
shingle_catch_all_2 Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
We have deposited diamond thin films remote from the active plasma region using an electron cyclotron resonance chemical vapor deposition technique. Diamond films were fabricated at temperatures in the range of 550–650 °C and gas pressures between 25 and 60 mTorr. The volume ratio of water to methanol was varied from 1:20 to 1:5 to optimize diamond film growth. High methanol content resulted in multiple nucleation in the growing diamond film, while higher water content led to complete etching of the film. A positive electrical bias was found to be essential for diamond thin film growth remote from the plasma region. The films were characterized by x-ray diffraction, micro-Raman, and scanning electron microscopy for phase identification, surface morphology, and bonding characteristics.
1077-3118
10773118
American Institute of Physics (AIP)
shingle_catch_all_3 Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
We have deposited diamond thin films remote from the active plasma region using an electron cyclotron resonance chemical vapor deposition technique. Diamond films were fabricated at temperatures in the range of 550–650 °C and gas pressures between 25 and 60 mTorr. The volume ratio of water to methanol was varied from 1:20 to 1:5 to optimize diamond film growth. High methanol content resulted in multiple nucleation in the growing diamond film, while higher water content led to complete etching of the film. A positive electrical bias was found to be essential for diamond thin film growth remote from the plasma region. The films were characterized by x-ray diffraction, micro-Raman, and scanning electron microscopy for phase identification, surface morphology, and bonding characteristics.
1077-3118
10773118
American Institute of Physics (AIP)
shingle_catch_all_4 Singh, R. K.
Gilbert, D.
Tellshow, R.
Holloway, P. H.
Ochoa, R.
Simmons, J. H.
Koba, R.
Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
We have deposited diamond thin films remote from the active plasma region using an electron cyclotron resonance chemical vapor deposition technique. Diamond films were fabricated at temperatures in the range of 550–650 °C and gas pressures between 25 and 60 mTorr. The volume ratio of water to methanol was varied from 1:20 to 1:5 to optimize diamond film growth. High methanol content resulted in multiple nucleation in the growing diamond film, while higher water content led to complete etching of the film. A positive electrical bias was found to be essential for diamond thin film growth remote from the plasma region. The films were characterized by x-ray diffraction, micro-Raman, and scanning electron microscopy for phase identification, surface morphology, and bonding characteristics.
1077-3118
10773118
American Institute of Physics (AIP)
shingle_title_1 Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
shingle_title_2 Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
shingle_title_3 Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
shingle_title_4 Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
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source_archive AIP Digital Archive
timestamp 2024-05-06T08:03:48.588Z
titel Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
titel_suche Low-pressure, low-temperature, and remote-plasma deposition of diamond thin films from water-methanol mixtures
topic U
uid nat_lic_papers_NLZ218239394