Polarity inversion of CdTe(111) orientation grown on Bi (00.1) by molecular beam epitaxy
DiVenere, A. ; Yi, X. J. ; Hou, C. L. ; Wang, H. C. ; Ketterson, J. B. ; Wong, G. K. ; Sou, I. K.
Woodbury, NY : American Institute of Physics (AIP)
Published 1993
Woodbury, NY : American Institute of Physics (AIP)
Published 1993
| ISSN: |
1077-3118
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Using in situ reflection high-energy electron diffraction analysis and chemical etching it is shown that CdTe grown on Bi layers deposited on CdTe (1¯1¯1¯)B terminated surfaces result in (111)A terminated surfaces. The Bi layers exhibit streaked diffraction patterns with clear Kikuchi lines; this is the first direct evidence for the layer by layer two-dimensional growth of Bi on CdTe by molecular beam epitaxy.
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| Type of Medium: |
Electronic Resource
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| URL: |