Ultrahigh finesse microcavity with distributed Bragg reflectors
Stanley, R. P. ; Houdré, R. ; Oesterle, U. ; Gailhanou, M. ; Ilegems, M.
Woodbury, NY : American Institute of Physics (AIP)
Published 1994
Woodbury, NY : American Institute of Physics (AIP)
Published 1994
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
We have grown a very high finesse microcavity using distributed Bragg reflectors of AlxGa1−xAs and AlAs. The measured Fabry–Pérot mode has a linewidth of 0.84 A(ring) at 930 nm. This implies a finesse in excess of 5500 and an effective (mirror corrected) finesse greater than 1450. Comparison with theoretical calculations for such a structure shows that (i) the growth rates are stable to 0.25% over 14 h and (ii) the internal losses are less than 1 cm−1. © 1994 American Institue of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |