Lu, Z. H., Mitchell, D. F., & Graham, M. J. (1994). Quantitative analysis of low-energy Xe+ ion bombardment damage of Si(100) surfaces using x-ray photoelectron spectroscopy. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationLu, Z. H., D. F. Mitchell, and M. J. Graham. Quantitative Analysis of Low-energy Xe+ Ion Bombardment Damage of Si(100) Surfaces Using X-ray Photoelectron Spectroscopy. Woodbury, NY: American Institute of Physics (AIP), 1994.
MLA (9th ed.) CitationLu, Z. H., et al. Quantitative Analysis of Low-energy Xe+ Ion Bombardment Damage of Si(100) Surfaces Using X-ray Photoelectron Spectroscopy. American Institute of Physics (AIP), 1994.
Warning: These citations may not always be 100% accurate.