Observation of Josephson effect in YBa2Cu3O7−x/Nd1.85Ce0.15CuO4−y bilayer junctions
Takeuchi, I. ; Mao, S. N. ; Xi, X. X. ; Petersen, K. ; Lobb, C. J. ; Venkatesan, T.
Woodbury, NY : American Institute of Physics (AIP)
Published 1995
Woodbury, NY : American Institute of Physics (AIP)
Published 1995
| ISSN: |
1077-3118
|
|---|---|
| Source: |
AIP Digital Archive
|
| Topics: |
Physics
|
| Notes: |
Josephson junctions were fabricated at the interface of YBa2Cu3O7−x (YBCO) and Nd1.85Ce0.15CuO4−y (NCCO) in heteroepitaxially grown superconducting bilayers. Devices of various configurations and sizes were fabricated, and they display a resistively shunted junction like I–V characteristics with hysteresis at low temperatures. A clear ac Josephson effect was observed under microwave irradiation, and critical currents were completely suppressible by external magnetic fields. Oxygen diffusion or charge diffusion at the interface are possible origins for the barrier formation. © 1995 American Institute of Physics.
|
| Type of Medium: |
Electronic Resource
|
| URL: |