A design of reflection scanning near-field optical microscope and its application to AlGaAs/GaAs heterostructures
Guttroff, G. ; Keto, J. M. ; Shih, C. K. ; Anselm, A. ; Streetman, B. G.
Woodbury, NY : American Institute of Physics (AIP)
Published 1996
Woodbury, NY : American Institute of Physics (AIP)
Published 1996
| ISSN: |
1077-3118
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
A scanning near-field microscope design using the reflected light intensity as the feedback mechanism is described. Multiple fibers with high numerical apertures provide a high collection efficiency in a reflection geometry. The performance with regard to its response to large spatial variations has been tested by using a Si-grating sample and with regard to variations of local indices of refraction by using GaAs/AlGaAs heterostructure samples. In addition, spatially resolved spectroscopy on GaAs/AlGaAs heterostructures has been obtained. © 1996 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |