APA (7th ed.) Citation

Dura, J. A., Pellegrino, J. G., & Richter, C. A. (1996). X-ray reflectivity determination of interface roughness correlated with transport properties of (AlGa)As/GaAs high electron mobility transistor devices. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Dura, J. A., J. G. Pellegrino, and C. A. Richter. X-ray Reflectivity Determination of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices. Woodbury, NY: American Institute of Physics (AIP), 1996.

MLA (9th ed.) Citation

Dura, J. A., et al. X-ray Reflectivity Determination of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices. American Institute of Physics (AIP), 1996.