APA (7th ed.) Citation

Gong, F. F., Shen, H. M., & Wang, Y. N. (1996). Structures and defects induced during annealing of sputtered near-equiatomic NiTi shape memory thin films. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Gong, F. F., H. M. Shen, and Y. N. Wang. Structures and Defects Induced During Annealing of Sputtered Near-equiatomic NiTi Shape Memory Thin Films. Woodbury, NY: American Institute of Physics (AIP), 1996.

MLA (9th ed.) Citation

Gong, F. F., et al. Structures and Defects Induced During Annealing of Sputtered Near-equiatomic NiTi Shape Memory Thin Films. American Institute of Physics (AIP), 1996.