Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films
Takeuchi, I. ; Wei, T. ; Duewer, Fred ; Yoo, Y. K. ; Xiang, X.-D.
Woodbury, NY : American Institute of Physics (AIP)
Published 1997
Woodbury, NY : American Institute of Physics (AIP)
Published 1997
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
We have explored the low temperature capability of a scanning-tip microwave near-field microscope to study superconductors. The shift in the quality factor of the microscope resonator can be used to obtain the temperature dependence of the surface resistance of a local region under the tip. Patterned YBa2Cu3O7−x films were scanned at various temperatures and surface resistance mapping was performed with high spatial resolution at 1.2 GHz. Superconducting transitions at different positions on a film can be detected. Edge-region defects in wet-etched patterns were observed and were shown to be nonsuperconducting at microwave frequencies at 80 K. © 1997 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |