Noise characteristics of 850 nm single-mode vertical cavity surface emitting lasers
Wiedenmann, D. ; Schnitzer, P. ; Jung, C. ; Grabherr, M. ; Jäger, R. ; Michalzik, R. ; Ebeling, K. J.
Woodbury, NY : American Institute of Physics (AIP)
Published 1998
Woodbury, NY : American Institute of Physics (AIP)
Published 1998
| ISSN: |
1077-3118
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
We have measured the noise characteristics of single-mode oxide confined surface emitting vertical cavity laser diodes. For pumping levels of more than 3.5 times threshold current, the relative intensity noise is below −150 dB/Hz up to 5 GHz at output powers near 1 mW. For various frequencies, we observe sub-Poissonian noise. © 1998 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |