Blue emission from Tm-doped GaN electroluminescent devices

Steckl, A. J. ; Garter, M. ; Lee, D. S. ; Heikenfeld, J. ; Birkhahn, R.

Woodbury, NY : American Institute of Physics (AIP)
Published 1999
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Blue emission has been obtained at room temperature from Tm-doped GaN electroluminescent devices. The GaN was grown by molecular beam epitaxy on Si(111) substrates using solid sources (for Ga and Tm) and a plasma source for N2. Indium–tin–oxide was deposited on the GaN layer and patterned to provide both the bias (small area) and ground (large area) transparent electrodes. Strong blue light emission under the bias electrode was observable with the naked eye at room temperature. The visible emission spectrum consists of a main contribution in the blue region at 477 nm corresponding to the Tm transition from the 1G4 to the 3H6 ground state. A strong near-infrared peak was also observed at 802 nm. The relative blue emission efficiency was found to increase linearly with bias voltage and current beyond certain turn-on levels. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
_version_ 1798289606843564034
autor Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
autorsonst Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
book_url http://dx.doi.org/10.1063/1.124958
datenlieferant nat_lic_papers
hauptsatz hsatz_simple
identnr NLZ218074530
issn 1077-3118
journal_name Applied Physics Letters
materialart 1
notes Blue emission has been obtained at room temperature from Tm-doped GaN electroluminescent devices. The GaN was grown by molecular beam epitaxy on Si(111) substrates using solid sources (for Ga and Tm) and a plasma source for N2. Indium–tin–oxide was deposited on the GaN layer and patterned to provide both the bias (small area) and ground (large area) transparent electrodes. Strong blue light emission under the bias electrode was observable with the naked eye at room temperature. The visible emission spectrum consists of a main contribution in the blue region at 477 nm corresponding to the Tm transition from the 1G4 to the 3H6 ground state. A strong near-infrared peak was also observed at 802 nm. The relative blue emission efficiency was found to increase linearly with bias voltage and current beyond certain turn-on levels. © 1999 American Institute of Physics.
package_name American Institute of Physics (AIP)
publikationsjahr_anzeige 1999
publikationsjahr_facette 1999
publikationsjahr_intervall 8004:1995-1999
publikationsjahr_sort 1999
publikationsort Woodbury, NY
publisher American Institute of Physics (AIP)
reference 75 (1999), S. 2184-2186
search_space articles
shingle_author_1 Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
shingle_author_2 Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
shingle_author_3 Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
shingle_author_4 Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
shingle_catch_all_1 Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
Blue emission from Tm-doped GaN electroluminescent devices
Blue emission has been obtained at room temperature from Tm-doped GaN electroluminescent devices. The GaN was grown by molecular beam epitaxy on Si(111) substrates using solid sources (for Ga and Tm) and a plasma source for N2. Indium–tin–oxide was deposited on the GaN layer and patterned to provide both the bias (small area) and ground (large area) transparent electrodes. Strong blue light emission under the bias electrode was observable with the naked eye at room temperature. The visible emission spectrum consists of a main contribution in the blue region at 477 nm corresponding to the Tm transition from the 1G4 to the 3H6 ground state. A strong near-infrared peak was also observed at 802 nm. The relative blue emission efficiency was found to increase linearly with bias voltage and current beyond certain turn-on levels. © 1999 American Institute of Physics.
1077-3118
10773118
American Institute of Physics (AIP)
shingle_catch_all_2 Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
Blue emission from Tm-doped GaN electroluminescent devices
Blue emission has been obtained at room temperature from Tm-doped GaN electroluminescent devices. The GaN was grown by molecular beam epitaxy on Si(111) substrates using solid sources (for Ga and Tm) and a plasma source for N2. Indium–tin–oxide was deposited on the GaN layer and patterned to provide both the bias (small area) and ground (large area) transparent electrodes. Strong blue light emission under the bias electrode was observable with the naked eye at room temperature. The visible emission spectrum consists of a main contribution in the blue region at 477 nm corresponding to the Tm transition from the 1G4 to the 3H6 ground state. A strong near-infrared peak was also observed at 802 nm. The relative blue emission efficiency was found to increase linearly with bias voltage and current beyond certain turn-on levels. © 1999 American Institute of Physics.
1077-3118
10773118
American Institute of Physics (AIP)
shingle_catch_all_3 Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
Blue emission from Tm-doped GaN electroluminescent devices
Blue emission has been obtained at room temperature from Tm-doped GaN electroluminescent devices. The GaN was grown by molecular beam epitaxy on Si(111) substrates using solid sources (for Ga and Tm) and a plasma source for N2. Indium–tin–oxide was deposited on the GaN layer and patterned to provide both the bias (small area) and ground (large area) transparent electrodes. Strong blue light emission under the bias electrode was observable with the naked eye at room temperature. The visible emission spectrum consists of a main contribution in the blue region at 477 nm corresponding to the Tm transition from the 1G4 to the 3H6 ground state. A strong near-infrared peak was also observed at 802 nm. The relative blue emission efficiency was found to increase linearly with bias voltage and current beyond certain turn-on levels. © 1999 American Institute of Physics.
1077-3118
10773118
American Institute of Physics (AIP)
shingle_catch_all_4 Steckl, A. J.
Garter, M.
Lee, D. S.
Heikenfeld, J.
Birkhahn, R.
Blue emission from Tm-doped GaN electroluminescent devices
Blue emission has been obtained at room temperature from Tm-doped GaN electroluminescent devices. The GaN was grown by molecular beam epitaxy on Si(111) substrates using solid sources (for Ga and Tm) and a plasma source for N2. Indium–tin–oxide was deposited on the GaN layer and patterned to provide both the bias (small area) and ground (large area) transparent electrodes. Strong blue light emission under the bias electrode was observable with the naked eye at room temperature. The visible emission spectrum consists of a main contribution in the blue region at 477 nm corresponding to the Tm transition from the 1G4 to the 3H6 ground state. A strong near-infrared peak was also observed at 802 nm. The relative blue emission efficiency was found to increase linearly with bias voltage and current beyond certain turn-on levels. © 1999 American Institute of Physics.
1077-3118
10773118
American Institute of Physics (AIP)
shingle_title_1 Blue emission from Tm-doped GaN electroluminescent devices
shingle_title_2 Blue emission from Tm-doped GaN electroluminescent devices
shingle_title_3 Blue emission from Tm-doped GaN electroluminescent devices
shingle_title_4 Blue emission from Tm-doped GaN electroluminescent devices
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timestamp 2024-05-06T08:03:30.655Z
titel Blue emission from Tm-doped GaN electroluminescent devices
titel_suche Blue emission from Tm-doped GaN electroluminescent devices
topic U
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