Copper thin films used as transmission remoderators for slow positron beams
Brusa, R. S. ; Deng, W. ; Checchetto, R. ; Karwasz, G. P. ; Zecca, A.
Woodbury, NY : American Institute of Physics (AIP)
Published 2000
Woodbury, NY : American Institute of Physics (AIP)
Published 2000
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
The positron remoderation efficiency of self-supported copper films 1000–5000 Å thick was measured by a slow positron beam at impinging positron energies between 1 and 20 keV. A maximum efficiency of 11.5 (−1+3)% was found. It has been shown that copper films are easily produced. A relatively low temperature annealing ((similar, equals)450 °C) is needed to remoderate positrons. These properties make them good candidate for positron beams with brightness enhancement stage in transmission geometry. © 2000 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |