Structural origin of coercivity enhancement and exchange-bias field in double antiferromagnet/ferromagnet bilayers
Hou, C. ; Fujiwara, H. ; Zhang, K.
Woodbury, NY : American Institute of Physics (AIP)
Published 2000
Woodbury, NY : American Institute of Physics (AIP)
Published 2000
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
An experimental method to identify the structural origins of the coercivity enhancement and the exchange-bias field of polycrystalline ferro-antiferromagnetic (F/AF) coupled systems is proposed. The exchange-bias field and the coercivity of the FI layer of the samples of the structure FI/AFI are compared with those of the FII layer of the samples of the structure FII/AFII/FIII/AFIII. It is concluded that, for a given temperature, it is those AF grains which stop their growth at a critical thickness that contribute to the coercivity enhancement, and those which grow over the critical thickness that contribute to the exchange-bias field. Meanwhile the effective magnetic surface anisotropy introduced to the top surface of the AFII layer by the FIII layer can increase the exchange-bias field of the FII layer when the AFII layer is thin. © 2000 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |