Reduced magnetoresistance in magnetic tunnel junctions caused by geometrical artifacts
Matsuda, K. ; Watari, N. ; Kamijo, A. ; Tsuge, H.
Woodbury, NY : American Institute of Physics (AIP)
Published 2000
Woodbury, NY : American Institute of Physics (AIP)
Published 2000
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Spuriously reduced magnetoresistance (MR) ratios have been observed in magnetic tunnel junctions in which a square contact portion with dimensions smaller than the width of the lead electrodes connects both the top and bottom lead electrodes. The phenomenon becomes apparent by measuring the magnetoresistance of the junctions with various sizes systematically varied under a fixed line width of the electrodes. Observed junction size dependence of resistance (R)×area(A) products and MR ratios were analyzed through finite difference calculation, and it was found that there exist junction sizes for which R×A products and MR ratios are larger and smaller, respectively, than the intrinsic ones. © 2000 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |