X-ray reflectivity and nanotribological study of deposition-energy-dependent thin CNx overcoats on CoCr magnetic films
Liu, W. J. ; Zhou, J. N. ; Rar, A. ; Barnard, J. A.
Woodbury, NY : American Institute of Physics (AIP)
Published 2001
Woodbury, NY : American Institute of Physics (AIP)
Published 2001
| ISSN: |
1077-3118
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Using a combination of high-resolution x-ray reflectivity (XRR), nanotribological, and x-ray photoelectron spectroscopy (XPS) techniques, a thorough description of the structural parameters of ultrathin CNx overcoats on CoCr magnetic films is obtained. In addition, the tribological performance as a function of deposition energy is shown to correlate well with trends found by XRR and XPS. © 2001 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |