Comparison of Josephson vortex flow transistors with different gate line configurations

Schuler, J. ; Weiss, S. ; Bauch, T. ; Marx, A. ; Koelle, D. ; Gross, R.

Woodbury, NY : American Institute of Physics (AIP)
Published 2001
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We performed numerical simulations and experiments on Josephson vortex flow transistors based on parallel arrays of YBa2Cu3O7–δ grain boundary junctions with a cross gate line allowing us to operate the same devices in two different modes named the Josephson fluxon transistor (JFT) and Josephson fluxon–antifluxon transistor (JFAT). The simulations yield a general expression for the current gain versus number of junctions and normalized loop inductance and predict higher current gain for the JFAT. The experiments are in good agreement with simulations and show improved coupling between gate line and junctions for the JFAT as compared to the JFT. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL: