Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
We demonstrate ultrafast dynamical imaging of surfaces using a junction-mixing scanning tunneling microscope. We detect picosecond transient voltage pulses on a microstrip transmission line and demonstrate a temporal resolution (full width at half maximum) of 8 ps. We show that the time resolution achieved in these experiments is limited mostly by the microstrip geometry and can be significantly improved by reducing the value of the transmission line impedance. By dynamically imaging the microstrip line and detecting picosecond voltage pulses propagating on a patterned metal-on-metal (Ti/Pt) structure, we demonstrate that 1 nm spatial resolution is achievable for a 13 ps (full width at half maximum) transient correlated signal. © 2002 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |
| _version_ | 1798289597459857408 |
|---|---|
| autor | Yarotski, D. A. Taylor, A. J. |
| autorsonst | Yarotski, D. A. Taylor, A. J. |
| book_url | http://dx.doi.org/10.1063/1.1490402 |
| datenlieferant | nat_lic_papers |
| hauptsatz | hsatz_simple |
| identnr | NLZ217995454 |
| issn | 1077-3118 |
| journal_name | Applied Physics Letters |
| materialart | 1 |
| notes | We demonstrate ultrafast dynamical imaging of surfaces using a junction-mixing scanning tunneling microscope. We detect picosecond transient voltage pulses on a microstrip transmission line and demonstrate a temporal resolution (full width at half maximum) of 8 ps. We show that the time resolution achieved in these experiments is limited mostly by the microstrip geometry and can be significantly improved by reducing the value of the transmission line impedance. By dynamically imaging the microstrip line and detecting picosecond voltage pulses propagating on a patterned metal-on-metal (Ti/Pt) structure, we demonstrate that 1 nm spatial resolution is achievable for a 13 ps (full width at half maximum) transient correlated signal. © 2002 American Institute of Physics. |
| package_name | American Institute of Physics (AIP) |
| publikationsjahr_anzeige | 2002 |
| publikationsjahr_facette | 2002 |
| publikationsjahr_intervall | 7999:2000-2004 |
| publikationsjahr_sort | 2002 |
| publikationsort | Woodbury, NY |
| publisher | American Institute of Physics (AIP) |
| reference | 81 (2002), S. 1143-1145 |
| search_space | articles |
| shingle_author_1 | Yarotski, D. A. Taylor, A. J. |
| shingle_author_2 | Yarotski, D. A. Taylor, A. J. |
| shingle_author_3 | Yarotski, D. A. Taylor, A. J. |
| shingle_author_4 | Yarotski, D. A. Taylor, A. J. |
| shingle_catch_all_1 | Yarotski, D. A. Taylor, A. J. Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy We demonstrate ultrafast dynamical imaging of surfaces using a junction-mixing scanning tunneling microscope. We detect picosecond transient voltage pulses on a microstrip transmission line and demonstrate a temporal resolution (full width at half maximum) of 8 ps. We show that the time resolution achieved in these experiments is limited mostly by the microstrip geometry and can be significantly improved by reducing the value of the transmission line impedance. By dynamically imaging the microstrip line and detecting picosecond voltage pulses propagating on a patterned metal-on-metal (Ti/Pt) structure, we demonstrate that 1 nm spatial resolution is achievable for a 13 ps (full width at half maximum) transient correlated signal. © 2002 American Institute of Physics. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_2 | Yarotski, D. A. Taylor, A. J. Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy We demonstrate ultrafast dynamical imaging of surfaces using a junction-mixing scanning tunneling microscope. We detect picosecond transient voltage pulses on a microstrip transmission line and demonstrate a temporal resolution (full width at half maximum) of 8 ps. We show that the time resolution achieved in these experiments is limited mostly by the microstrip geometry and can be significantly improved by reducing the value of the transmission line impedance. By dynamically imaging the microstrip line and detecting picosecond voltage pulses propagating on a patterned metal-on-metal (Ti/Pt) structure, we demonstrate that 1 nm spatial resolution is achievable for a 13 ps (full width at half maximum) transient correlated signal. © 2002 American Institute of Physics. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_3 | Yarotski, D. A. Taylor, A. J. Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy We demonstrate ultrafast dynamical imaging of surfaces using a junction-mixing scanning tunneling microscope. We detect picosecond transient voltage pulses on a microstrip transmission line and demonstrate a temporal resolution (full width at half maximum) of 8 ps. We show that the time resolution achieved in these experiments is limited mostly by the microstrip geometry and can be significantly improved by reducing the value of the transmission line impedance. By dynamically imaging the microstrip line and detecting picosecond voltage pulses propagating on a patterned metal-on-metal (Ti/Pt) structure, we demonstrate that 1 nm spatial resolution is achievable for a 13 ps (full width at half maximum) transient correlated signal. © 2002 American Institute of Physics. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_4 | Yarotski, D. A. Taylor, A. J. Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy We demonstrate ultrafast dynamical imaging of surfaces using a junction-mixing scanning tunneling microscope. We detect picosecond transient voltage pulses on a microstrip transmission line and demonstrate a temporal resolution (full width at half maximum) of 8 ps. We show that the time resolution achieved in these experiments is limited mostly by the microstrip geometry and can be significantly improved by reducing the value of the transmission line impedance. By dynamically imaging the microstrip line and detecting picosecond voltage pulses propagating on a patterned metal-on-metal (Ti/Pt) structure, we demonstrate that 1 nm spatial resolution is achievable for a 13 ps (full width at half maximum) transient correlated signal. © 2002 American Institute of Physics. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_title_1 | Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy |
| shingle_title_2 | Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy |
| shingle_title_3 | Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy |
| shingle_title_4 | Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy |
| sigel_instance_filter | dkfz geomar wilbert ipn albert |
| source_archive | AIP Digital Archive |
| timestamp | 2024-05-06T08:03:22.334Z |
| titel | Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy |
| titel_suche | Improved temporal resolution in junction-mixing ultrafast scanning tunneling microscopy |
| topic | U |
| uid | nat_lic_papers_NLZ217995454 |