Measurements of the anisotropic etching of a single-crystal silicon sphere in aqueous cesium hydroxide

Ju, C. ; Hesketh, P.J.

Amsterdam : Elsevier

ISSN:	0924-4247
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Electrical Engineering, Measurement and Control Technology
Type of Medium:	Electronic Resource
URL:	http://dx.doi.org/10.1016/0924-4247(92)80166-Z