X-ray photoelectron spectroscopy studies of high-dose nitrogen ion implanted-chromium: a possibility of a standard material for chemical state analysis

Nishimura, O. ; Yabe, K. ; Iwaki, M.

Amsterdam : Elsevier

ISSN:	0368-2048
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Physics
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0368-2048(89)85021-2