Applications of a high spatial resolution combined AES/SIMS instrument

Bishop, H. ; Moon, D. ; Marriott, P. ; Chalker, P.

Amsterdam : Elsevier
ISSN:
0042-207X
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Physics
Type of Medium:
Electronic Resource
URL: