Behavior of types A and B hole traps in n-type GaAs during long-period operation

Zhou, J. ; Zhan, Q. ; Fu, Z. ; Lu, D. ; Guan, L. ; Chen, H.

Amsterdam : Elsevier

ISSN:	0038-1101
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Electrical Engineering, Measurement and Control Technology Physics
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0038-1101(92)90167-B