Delineation of defects in SIMOX structures using a chemical etching technique

F Giles, L. ; Nejim, A. ; L F Hemment, P. ; W Fan, T.

Amsterdam : Elsevier
ISSN:
0042-207X
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Physics
Type of Medium:
Electronic Resource
URL: