Measurement of the thickness dependence of absorption in HfO"2 and ZnS single-layer films

Coriand, F. ; Walther, H.-G. ; Welsch, E. ; Schafer, D. ; Wolf, R.

Amsterdam : Elsevier

ISSN:	0040-6090
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Physics
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0040-6090(85)90293-7