Influence of geometry on angle-dependent critical current density measurements in thin-film superconductors

Theuss, H. ; Becker, T. ; Kronmuller, H.

Amsterdam : Elsevier
ISSN:
0921-4534
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Physics
Type of Medium:
Electronic Resource
URL: