Influence of geometry on angle-dependent critical current density measurements in thin-film superconductors

Theuss, H. ; Becker, T. ; Kronmuller, H.

Amsterdam : Elsevier

ISSN:	0921-4534
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Physics
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0921-4534(94)00578-8