Yao, X., Qin, G., Jia, T., Luo, S., & Lan, L. Electron irradiation-induced defects in lithium doped n-type silicon with different oxygen concentrations. Elsevier.
Chicago Style (17th ed.) CitationYao, X., G. Qin, T. Jia, S. Luo, and L. Lan. Electron Irradiation-induced Defects in Lithium Doped N-type Silicon with Different Oxygen Concentrations. Amsterdam: Elsevier.
MLA (9th ed.) CitationYao, X., et al. Electron Irradiation-induced Defects in Lithium Doped N-type Silicon with Different Oxygen Concentrations. Elsevier.
Warning: These citations may not always be 100% accurate.