Electron irradiation-induced defects in lithium doped n-type silicon with different oxygen concentrations

Yao, X. ; Qin, G. ; Jia, T. ; Luo, S. ; Lan, L.

Amsterdam : Elsevier

ISSN:	0375-9601
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Physics
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0375-9601(88)90361-1