Design and development of an ultrahigh vacuum high-resolution transmission electron microscope
Kondo, Y. ; Ohi, K. ; Ishibashi, Y. ; Hirano, H. ; Harada, Y. ; Takayanagi, K. ; Tanishiro, Y. ; Kobayashi, K. ; Yagi, K.
Amsterdam : Elsevier
Amsterdam : Elsevier
ISSN: |
0304-3991
|
---|---|
Source: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
|
Topics: |
Electrical Engineering, Measurement and Control Technology
Natural Sciences in General
Physics
|
Type of Medium: |
Electronic Resource
|
URL: |