Impurity and defect distribution in ZnTe/GaAs epilayers of different thickness
Kudlek, K. ; Presser, N. ; Gutowski, J. ; Hingerl, K. ; Abramof, E. ; Pesek, A. ; Pauli, H. ; Sitter, H.
Amsterdam : Elsevier
Amsterdam : Elsevier
| ISSN: |
0022-0248
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|---|---|
| Source: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
|
| Topics: |
Chemistry and Pharmacology
Geosciences
Physics
|
| Type of Medium: |
Electronic Resource
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| URL: |