Holographic visualization of flaws using magnetic stressing

Mehta, P.C. ; Mohan, D. ; Bhan, C. ; Lal, P. ; Hradaynath, R.

Amsterdam : Elsevier

ISSN:	0030-3992
Keywords:	holographic interferometry ; magnetic stressing ; non-destructive testing
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Electrical Engineering, Measurement and Control Technology Physics
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0030-3992(82)90052-4