Modelling of rapid thermal processing

Vandenabeele, P. ; Maex, K.

Amsterdam : Elsevier
ISSN:
0167-9317
Keywords:
Rapid thermal processing (RTP) ; emissitivity ; pyrometers ; temperature uniformity
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Type of Medium:
Electronic Resource
URL: