X-ray diffraction analysis of low mismatch epitaxial layers grown on misoriented substrates

Gailhanou, M. ; Carlin, J.F. ; Oesterle, U.

Amsterdam : Elsevier
ISSN:
0022-0248
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Chemistry and Pharmacology
Geosciences
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0022-0248(94)90514-2