Contradictory increase of critical layer thickness in In"xGa"1"-"xSb/GaAs heterostructures grown by MBE

ISSN:
0304-3991
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Natural Sciences in General
Physics
Type of Medium:
Electronic Resource
URL: