High-resolution electron microscopy of structural defects in organic crystals

Kobayashi, T. ; Fujiyoshi, Y. ; Uyeda, N.

Amsterdam : Elsevier
ISSN:
0022-0248
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Chemistry and Pharmacology
Geosciences
Physics
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1016/0022-0248(83)90095-7