APA (7th ed.) Citation

Kuz’menko, R. V., Ganzha, A. V., Bochurova, O. V., Domashevskaya, É. P., Schreiber, J., Hildebrandt, S., . . . Schlachetzki, A. (2000). Temperature dependence of residual stress in epitaxial GaAs/Si(100) films determined from photoreflectance spectroscopy data. Springer.

Chicago Style (17th ed.) Citation

Kuz’menko, R. V., A. V. Ganzha, O. V. Bochurova, É. P. Domashevskaya, J. Schreiber, S. Hildebrandt, S. Mo, E. Peiner, and A. Schlachetzki. Temperature Dependence of Residual Stress in Epitaxial GaAs/Si(100) Films Determined from Photoreflectance Spectroscopy Data. Springer, 2000.

MLA (9th ed.) Citation

Kuz’menko, R. V., et al. Temperature Dependence of Residual Stress in Epitaxial GaAs/Si(100) Films Determined from Photoreflectance Spectroscopy Data. Springer, 2000.