APA (7th ed.) Citation

Chattopadhyay, S., Bera, L. K., Maiti, C. K., Ray, S. K., Bose, P. K., Dentel, D., . . . Bischoff, J. L. (1998). Determination of interface state density of PtSi/strained-Si1-xGex/Si Schottky diodes. Springer.

Chicago Style (17th ed.) Citation

Chattopadhyay, S., L. K. Bera, C. K. Maiti, S. K. Ray, P. K. Bose, D. Dentel, L. Kubler, and J. L. Bischoff. Determination of Interface State Density of PtSi/strained-Si1-xGex/Si Schottky Diodes. Springer, 1998.

MLA (9th ed.) Citation

Chattopadhyay, S., et al. Determination of Interface State Density of PtSi/strained-Si1-xGex/Si Schottky Diodes. Springer, 1998.