β-radiation detected nuclear magnetic resonance studies of point defects in semiconductors
Ittermann, B. ; Ackermann, H. ; Diehl, E. ; Fischer, B. ; Frank, H. -P. ; Stöckmann, H. -J.
Springer
Published 1993
Springer
Published 1993
| ISSN: |
1572-9540
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|---|---|
| Source: |
Springer Online Journal Archives 1860-2000
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| Topics: |
Physics
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| Notes: |
Abstract An introduction to the principles of the β-NMR method is presented and its potential in the field of defect research in semiconductors is discussed. This is followed by a review of experimental applications to date and a description of several examples in some detail.
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| Type of Medium: |
Electronic Resource
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| URL: |