Testing quantum fault tolerance on small systems

D. Willsch, M. Willsch, F. Jin, H. De Raedt, and K. Michielsen
American Physical Society (APS)
Published 2018
Publication Date:
2018-11-29
Publisher:
American Physical Society (APS)
Print ISSN:
1050-2947
Electronic ISSN:
1094-1622
Topics:
Physics
Keywords:
Quantum information
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