Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces
S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando
American Physical Society (APS)
Published 2018
American Physical Society (APS)
Published 2018
| Publication Date: |
2018-10-06
|
|---|---|
| Publisher: |
American Physical Society (APS)
|
| Print ISSN: |
0031-9007
|
| Electronic ISSN: |
1079-7114
|
| Topics: |
Physics
|
| Keywords: |
Condensed Matter: Electronic Properties, etc.
|
| Published by: |
| _version_ | 1836399063206985728 |
|---|---|
| autor | S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando |
| beschreibung | Author(s): S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando Electrolyte gating is a powerful means for tuning the carrier density and exploring the resultant modulation of novel properties on solid surfaces. However, the mechanism, especially its effect on the oxygen migration and electrostatic charging at the oxide heterostructures, is still unclear. Here w... [Phys. Rev. Lett. 121, 146802] Published Fri Oct 05, 2018 |
| citation_standardnr | 6341828 |
| datenlieferant | ipn_articles |
| feed_id | 52535 |
| feed_publisher | American Physical Society (APS) |
| feed_publisher_url | http://www.aps.org/ |
| insertion_date | 2018-10-06 |
| journaleissn | 1079-7114 |
| journalissn | 0031-9007 |
| publikationsjahr_anzeige | 2018 |
| publikationsjahr_facette | 2018 |
| publikationsjahr_intervall | 7984:2015-2019 |
| publikationsjahr_sort | 2018 |
| publisher | American Physical Society (APS) |
| quelle | Physical Review Letters |
| relation | http://link.aps.org/doi/10.1103/PhysRevLett.121.146802 |
| schlagwort | Condensed Matter: Electronic Properties, etc. |
| search_space | articles |
| shingle_author_1 | S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando |
| shingle_author_2 | S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando |
| shingle_author_3 | S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando |
| shingle_author_4 | S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando |
| shingle_catch_all_1 | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces Condensed Matter: Electronic Properties, etc. Author(s): S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando Electrolyte gating is a powerful means for tuning the carrier density and exploring the resultant modulation of novel properties on solid surfaces. However, the mechanism, especially its effect on the oxygen migration and electrostatic charging at the oxide heterostructures, is still unclear. Here w... [Phys. Rev. Lett. 121, 146802] Published Fri Oct 05, 2018 S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando American Physical Society (APS) 0031-9007 00319007 1079-7114 10797114 |
| shingle_catch_all_2 | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces Condensed Matter: Electronic Properties, etc. Author(s): S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando Electrolyte gating is a powerful means for tuning the carrier density and exploring the resultant modulation of novel properties on solid surfaces. However, the mechanism, especially its effect on the oxygen migration and electrostatic charging at the oxide heterostructures, is still unclear. Here w... [Phys. Rev. Lett. 121, 146802] Published Fri Oct 05, 2018 S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando American Physical Society (APS) 0031-9007 00319007 1079-7114 10797114 |
| shingle_catch_all_3 | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces Condensed Matter: Electronic Properties, etc. Author(s): S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando Electrolyte gating is a powerful means for tuning the carrier density and exploring the resultant modulation of novel properties on solid surfaces. However, the mechanism, especially its effect on the oxygen migration and electrostatic charging at the oxide heterostructures, is still unclear. Here w... [Phys. Rev. Lett. 121, 146802] Published Fri Oct 05, 2018 S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando American Physical Society (APS) 0031-9007 00319007 1079-7114 10797114 |
| shingle_catch_all_4 | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces Condensed Matter: Electronic Properties, etc. Author(s): S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando Electrolyte gating is a powerful means for tuning the carrier density and exploring the resultant modulation of novel properties on solid surfaces. However, the mechanism, especially its effect on the oxygen migration and electrostatic charging at the oxide heterostructures, is still unclear. Here w... [Phys. Rev. Lett. 121, 146802] Published Fri Oct 05, 2018 S. W. Zeng, X. M. Yin, T. S. Herng, K. Han, Z. Huang, L. C. Zhang, C. J. Li, W. X. Zhou, D. Y. Wan, P. Yang, J. Ding, A. T. S. Wee, J. M. D. Coey, T. Venkatesan, A. Rusydi, and A. Ariando American Physical Society (APS) 0031-9007 00319007 1079-7114 10797114 |
| shingle_title_1 | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces |
| shingle_title_2 | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces |
| shingle_title_3 | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces |
| shingle_title_4 | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces |
| timestamp | 2025-06-30T23:37:00.961Z |
| titel | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces |
| titel_suche | Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces |
| topic | U |
| uid | ipn_articles_6341828 |